Transmission Electron Microscopy (TEM)

Environmental Scanning Electron Microscopy (ESEM)
Field Emission Scanning Electron Microscopy (FESEM)
Dual Beam – Focused Ion Beam Microscopy (SEM-FIB)
X-Ray Photoelectron Spectroscopy (XPS)
Dynamic Mechanical Analysis (DMA)
Thermogravimetric Analysis (TGA)
Atomic Force Microscopy (AFM)
Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS)
Scanning Near-field Optical Microscopy (SNOM)
Photovoltaic Characterization Facility

Molecular Materials Analysis

  • Nicolet 6700 IR Spectrometer with Ge GATR, Diamond ATR, and Seagull reflectance accessory for in-situ and ex-situ analysis of powders and films
  • Wyatt Mobius Dynamic Light Scattering and Zeta Potential for analysis of molecules and colloids in solution
  • Rame-hart contact-angle goniometer for surface energy measurements

Rapid Materials Prototyping Facility (coming online late 2016/2017)

  • Direct-write laser lithography and mask writing tool (0.5 micron resolution) for rapid pattern generation
  • Mask aligner with backside alignment capability
  • Multiple materials deposition systems (e-beam, thermal, atomic layer deposition, sputter, plasma-enhanced CVD)
  • Variable angle spectroscopic ellipsometer for rapid film properties measurement

 

University of Oregon