WITEC alpha300 S Scanning Near-field Optical Microscope

SNOM features:

  • Micro-fabricated cantilever SNOM sensors
  • Aperture size typically 100 nm, other optional
  • Standard AFM cantilever probes
  • Beam-deflection distance control for SNOM and AFM
  • Low noise, highly focused optics for beam deflection laser
  • No interference with excitation laser
  • Ultra-low laser noise
  • Near-field Mode 100 nm, depending on aperture size; Confocal Mode typically 200 nm diffraction-limited

Typical Applications:

  • As scanning near-field microscopy requires only minimal sample preparation if any, it is ideally suited to quickly and effortlessly image the optical properties of a sample with resolution below the diffraction limit.
  • Typical applications are found in nanotechnology research and particularly in the highly relevant fields of Nano-Photonics and Nano-Optics.
  • In Life Science and materials research, SNOM allows the optical detection of the most miniscule surface structures of transparent as well as opaque samples.
  • Using fluorescence techniques, even single molecule detection is easily achievable.
University of Oregon