Facilities and Equipment
High-Resolution Analytical TEM Facility
State-of-the-art equipment to perform atomic-resolution imaging and nanoscale composition analyses of materials.
MicroAnalytical Facility
Resources for sample preparation and materials analysis by Electron Probe Micro Analysis (EPMA) and Environmental Scanning Electron Microscopy (ESEM).
Focused Ion Beam and Scanning Electron Microscope (FIB-SEM) Facility
Equipment supporting high-resolution scanning electron microscopy, focused ion-beam microscopy, and electron-beam lithography for nanofabrication and material characterization
NMR Spectroscopy Facility
Diverse array of magnetic resonance research capabilities for routine and advanced analysis of both solutions and solid state samples.
Polymer Characterization and Thermal Analysis Laboratory
Equipment to to determine the processing behavior and thermal and mechanical properties of polymeric materials and polymer based composites.
Microfabrication and Photovoltaic Characterization Facility
A shared user laboratory for the characterization, evaluation, and fabrication of microelectronic devices and photovoltaic cells.
Surface Analytical Facility
Instrumentation for characterizing the composition of the outermost few nanometers of materials, and for imaging surface topography and chemistry.
X-Ray Diffraction Lab
Equipment for using X-ray diffraction applications to study 3-D atomic structure and other characteristics for a wide range of materials.