Bruker AXS D8 Discover XRD System

Third generation Göbel Mirrors providing the x-ray highest flux density
System is designed for easy and failsafe operation
Motorized absorber allow fully automatic operation without user intervention
High performance optics provide the optimum resolution for each application and sample
Different types of Eulerian cradles provide advantage for residual stress, texture, micro-diffraction investigations
For x-ray reflectometry on coatings or semiconductors dedicated stages allow even temperature studies
Shortest measurement times achieved using Ultra GID and the VANTEC-1 detector.

Thin Film analysis solutions for quality control, product and process development.
XRD systems support comprehensive measurements, intelligent scripts take care of the routine work.