Digital Instruments Multimode Atomic Force Microscope with IIIa controller

AFM provides:

  • Imaging of surface atoms with a lateral resolution of 1Å and a vertical resolution of 0.1Å
  • Analysis under water and in controlled environments
  • Atomic-scale surface manipulation and modification
  • Quantitative measurement of surface roughness
  • Biorecognition imaging (with functionalized tips)

Typical Applications:

  • Imaging, measuring and manipulating matter at the nanoscale.
  • Information is gathered by “feeling” the surface with a mechanical probe.
  • Variable-deflection mode is useful for small, high-speed atomic resolution scans.
  • Lateral Force mode measures frictional forces on a surface.
  • Phase Imaging mode can be used to differentiate areas on a sample with such differing properties as friction, adhesion, and viscoelasticity.
  • Force Modulation mode allows comparison of both height and material properties.
University of Oregon