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The Alice C. Tyler facility provides an array of equipment supporting high-resolution electron microscopy, nanofabrication, and material characterization techniques. It offers high-resolution scanning electron microscopy (SEM) and focused ion beam microscopy (FIB, both plasma and LMIS) services, and electron- and ion-beam lithography. We are equipped to support samples from multiple disciplines, providing sample preparation and services for biological, materials, and geological applications. 

Instruments

• Scanning electron microscopes (SEM)
• Focused ion beam scanning electron microscope (FIB-SEM)
• Noble Dome air-free transfer system

Facility Contact: Valerie Brogden