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Equipment List

Transmission Electron Microscopy (TEM)

Electron Probe Micro Analysis (EPMA)

Environmental Scanning Electron Microscopy (ESEM)

FEI Quanta 200 ESEM/VPSEM Microscopes

Field Emission Scanning Electron Microscopy (FESEM)

ZEISS Ultra-55 Scanning Electron Microscope

Dual Beam - Focused Ion Beam Microscopy (DB-FIB)

FEI Helios Dual Beam FIB

Nuclear Magnetic Resonance Spectroscopy

X-Ray Photoelectron Spectroscopy (XPS)

ThermoScientific ESCALAB 250 X-ray Photoelectron Spectrometer

Dynamic Mechanical Analysis (DMA)

TA Instruments Dynamic Mechanical Analyzer (DMA Q800)

Differential Scanning Calorimetry (DSC)

Thermogravimetric Analysis (TGA)

TA Instruments Thermogravimetric Analyzer (TGA Q500)

Organic and Printed Electronics

Dimatix Precision Inkjet Materials Printer (DMP 2381)

Atomic Force Microscopy (AFM)

Digital Instruments Multimode Atomic Force Microscope with IIIa controller

Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS)

ION-TOF Model IV Time-of-Flight Secondary Ion Mass Spectrometer

Spectroscopic Ellipsometry (SE)

Woollam M44 Spectroscopic Ellipsometer

MALDI/ESI Mass Spectrometry

Waters Q-ToF Premier MALDI/ESI Tandem Mass Spectrometer

Scanning Near-field Optical Microscopy (SNOM)

WITEC alpha300 S Scanning Near-field Optical Microscope

X-ray Crystallography

Photovoltaics Characterization Facility