Schematic: A concentric hemispherical analyzer uses an electric field between two hemispherical surfaces to disperse the electrons according to their kinetic energy

Instrument Calendar:

• Thermo Hsi XPS

XPS provides:

• Identification of all elements (except H and He) present in the outermost 100Å of a surface in concentrations > 0.1 atomic %
• Determination of the elemental surface composition (±10%)
• Information on lateral variation in composition (resolution ˜ 150µm)
• Information about the molecular environment (oxidation state, bonding atoms, etc.)
• Also known as Electron Spectroscopy for Chemical Analysis (ESCA)

Typical Applications:

• Identification of organic groups using derivatization
• Nondestructive elemental depth profiles
• Destructive elemental depth profiles several thousand Å into the sample
• Variable temperature analysis

Survey Spectrum indicates all of the elements present in a given sample and can assist in determining composition.

Depth Profile shows variation of composition as a function of depth.