Surface Analytical Facility
Instrumentation
- WITEC alpha300 S Scanning Near-field Optical Microscope
- Waters Q-ToF Premier MALDI/ESI Tandem Mass Spectrometer
- Woollam M44 Spectroscopic Ellipsometer
- ION-TOF Model IV Time-of-Flight Secondary Ion Mass Spectrometer
- Digital Instruments Multimode Atomic Force Microscope with IIIa controller
- ThermoScientific ESCALAB 250 X-ray Photoelectron Spectrometer
Calendars
The CAMCOR Surface Analytical Facility houses instrumentation for characterizing the composition of the outermost few nanometers of materials, and for imaging surface topography and chemistry. Presently the main techniques available are X-Ray Photoelectron Spectroscopy (XPS), Ultraviolet Photoelectron Spectroscopy (UPS), Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS), Atomic Force Spectroscopy Microscopy (AFM), and Scanning Near-Field Optical Microscopy (SNOM) with Confocal Raman Capabilities.
Documentation:
Dr. Stephen Golledge
Director,
CAMCOR Surface Analytical Facility
golledge@uoregon.edu
541.346.3617