Multi-phase analysis of ore minerals with spatial “traceback” of oxygen

Instrument Calendar:

• Cameca SX50 EPMA

Cameca SX50 features:

• 4 Wavelength Dispersive Spectrometry (WDS) Bragg spectrometers
• Bruker 10mm Silicon Drift Detector (SDD)
• Energy Dispersive Spectrometry (EDS) detector with hyperspectral mapping
• Optimized for thin film and particle analysis

Typical Applications:

• Metallurgical studies, failure analysis, thin film, particulate analysis, mineral analysis, igneous petrology, semiconductor materials ceramic analysis, anthropological studies, art history and many others.

Ni-P oxide thin film on Si substrate. Multiple voltage EPMA analysis of thin film materials provides fast and accurate