Photovoltaics Characterization Facility
Dektak 6M stylus profilometer
Step height measurement of a polymer thin film on glass substrate.
Instrument Calendars:
Futures and specifications:
- 12.5 µm stylus with adjustable tracking force (1—15mg).
- Vertical range from 5 nm to 262 µm.
- Maximum vertical resolution ∼ 1 nm.
Typical application:
- Line by line step height measurements for determining thin film thickness and micro surface features.