What is the course schedule for the program?
Fall term
- Introduction to Electron Microscopy (4 credits)
- Electron Microprobe Analysis (4 credits)
- Introduction to Surface Analysis (4 credits)
- NMR for Materials (4 credits, optional elective)
Winter term
- Advanced TEM Analysis (4 credits)
- Advanced SEM/FIB Analysis (4 credits)
- Advanced Surface Analysis (4 credits)
- Electronics and Vacuum Systems (4 credits)
- Capstone Project (presentations at end of term)
Spring, summer, and fall terms
Research Internship (8-10 credits/term)
What are the courses offered in this program?
course | description |
|---|---|
CH610: Nuclear Magnetic Resonance for Materials | Introduction to basic nuclear magnetic resonance theory, data collection, and structure elucidation. |
CH680: Electronics and Vacuum Systems | Introduction to modern electronic components, circuits, basic vacuum theory, vacuum failure modes, measurement systems, and troubleshooting. |
CH681: Introduction to Electron Microscopy | Introduction to theory and best practices for applying scanning electron (SEM) and transmission electron microscopy (TEM) in materials science. |
CH682: Electron Microprobe Analysis | Introduction to the theory and operation of instrumentation for electron microprobe analysis (EPMA) in materials science and geochemistry. |
CH683: Introduction to Surface Analysis | Introduction to theory and best practices for surface analysis techniques (XPS and ToF-SIMS), with focus on applications for materials science. |
CH685: Advanced Transmission Electron Microscopy (TEM) Analysis | Advanced theory and practices for using transmission electron microscopy, as applied to materials science. |
CH686: Advanced Scanning Electron Microscopy (SEM)/ Focused Ion Beam (FIB) Analysis | Advanced theory and practices for using focused ion beam and scanning electron microscopy in research and nanofabrication. |
CH687: Advanced Surface Analysis | Advanced theory and practices for surface analysis spectroscopy, as applied to materials science. |