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This facility houses state-of-the-art scanning transmission electron microscopes (S/TEM) to perform atomic-resolution imaging and nanoscale composition analyses of hard and soft materials.  It is equipped to characterize sample types from multiple disciplines, such as semiconductor devices, solar cells, polymers, catalysts, nanoparticles, multilayer thin films, geological and biological samples.  Our instruments can perform the most advanced techniques in S/TEM, including:

• High-resolution transmission electron microscopy (HRTEM) 
• Probe-corrected atomic-resolution high-angle annular dark-field scanning transmission electron microscopy (HAADF-STEM) 
• Electron energy loss spectrometry (EELS) and Energy-filtered TEM (EFTEM) 
• Energy dispersive x-ray spectrometry (EDS/EDX) 
• Lorentz TEM and Lorentz STEM 
• Bright-/dark-field TEM 
• 4D-STEM, DPC-STEM, and iDPC-STEM 
• Selected area electron diffraction (SAED) and nano-diffraction

Instruments

• Transmission Electron Microscopes (TEM) 

Facility Contact: Josh Razink