Transmission Electron Microscopy (TEM)

S/TEM is capable of imaging, chemical, and structural analysis down to the Angstrom and sub-Angstrom length scales. This is done by accelerating high-energy electrons either in a broad beam (TEM) or in a focused probe (STEM) at a very thin sample. Electrons that are scattered through the sample are collected by various detectors to form images, diffraction patterns, and electron energy loss spectra. Additionally, X-ray detectors can be attached to the S/TEM to allow for energy dispersive X-ray analysis (EDS/EDX) of the composition of the sample.

Typical Applications

  • Imaging of hard and soft materials at the micron, nanometer, Angstrom, and sub-Angstrom length scales
  • Chemical analysis of hard and soft materials at the micron, nanometer, Angstrom, and sub-Angstrom length scales
  • Structural analysis of hard and soft materials at the micron, nanometer, Angstrom and sub-Angstrom length scales

Types of samples commonly characterized by S/TEM:

  • Semiconductor devices
  • Nanoparticles
  • Catalysts
  • Thin films
  • 2D-materials
  • Geological materials
  • Biological materials
  • Polymers

Instruments

The ThermoFisher Scientific Spectra 200 S/TEM.
ThermoFisher Scientific Spectra 200 S/TEM
  • Cold Field Emission Gun (CFEG) with an energy resolution ≤ 0.4eV
  • Available accelerating voltages: 60, 120, 200 keV
  • S-CORR Probe corrected STEM
    • @200keV point resolution ≤ 60pm with a probe current ≥ 100pA
    • @60keV point resolution ≤ 60pm with a probe current ≥ 100pA
  • TEM resolution ≤ 100pm @ 200keV
  • Super-X EDS with a detector solid angle ≥ 0.7 Sr
  • Dedicated high angle annular dark field detector (HAADF)
  • Segmented bright field (BF) and dark field (DF) detectors
  • Live iDPC for low dose and light element imaging
  • Electron Microscope Pixelated Detector (EMPAD) for 4D-STEM
  • Ceta-S Camera
    • ≥ 16M pixels (4096 x 4096)
    • ≥ 40 frames per second @ 4096 x 4096 pixel resolution
  • Lorentz TEM and Lorentz STEM for imaging magnetic materials
  • CEOS CEFID Imaging Energy filter for energy filtered TEM (EFTEM) and electron energy loss spectroscopy (EELS)
    • Equipped with a Dectris ELA hybrid-pixel detector and a TVIPS XF416R high resolution electron camera
  • Available holders: single tilt, double tilt, low background high visibility double tilt, and cyro holders
The FEI Tecnai G2 Spirit transmission electron microscope.
FEI Tecnai G2 Spirit TEM 
  • 80-120 keV thermionic electron source
  • TWIN lens configuration for high-contrast studies of materials and biological samples
  • Ability to do bright field and dark field imaging along with selected area diffraction analysis
  • Equipped with an FEI Eagle 4k CCD camera
  • Available holders:  single tilt, double tilt, and cyro holders

 

Instrument Contact: Josh Razink