Bruker AXS D8 Discover XRD System
D8 Discover features:
- Third generation Göbel Mirrors providing the x-ray highest flux density
- System is designed for easy and failsafe operation
- Motorized absorber allow fully automatic operation without user intervention
- High performance optics provide the optimum resolution for each application and sample
- Different types of Eulerian cradles provide advantage for residual stress, texture, micro-diffraction investigations
- For x-ray reflectometry on coatings or semiconductors dedicated stages allow even temperature studies
- Shortest measurement times achieved using Ultra GID and the VANTEC-1 detector.
- Thin Film analysis solutions for quality control, product and process development.
- XRD systems support comprehensive measurements, intelligent scripts take care of the routine work.