Surface Analytical Facility
The CAMCOR Surface Analytical Facility houses instrumentation for characterizing the composition of the outermost few nanometers of materials, and for imaging surface topography and chemistry. Presently the main techniques available are X-Ray Photoelectron Spectroscopy (XPS), Ultraviolet Photoelectron Spectroscopy (UPS), Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS), Atomic Force Spectroscopy Microscopy (AFM), and Scanning Near-Field Optical Microscopy (SNOM) with Confocal Raman Capabilities.
Dr. Stephen Golledge
CAMCOR Surface Analytical Facility