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X-Ray Photoelectron Spectroscopy (XPS)
ThermoScientific ESCALAB 250 X-ray Photoelectron Spectrometer
Kratos Hsi XPS
Instrument Calendar: XPS provides:
  • Identification of all elements (except H and He) present in the outermost 100Å of a surface in concentrations > 0.1 atomic %
  • Determination of the elemental surface composition (±10%)
  • Information on lateral variation in composition (resolution ˜ 150µm)
  • Information about the molecular environment (oxidation state, bonding atoms, etc.)
  • Also known as Electron Spectroscopy for Chemical Analysis (ESCA)
Typical Applications:
  • Identification of organic groups using derivatization
  • Nondestructive elemental depth profiles
  • Destructive elemental depth profiles several thousand Å into the sample
  • Variable temperature analysis
 
 
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