The CAMCOR Surface Analytical facility houses instrumentation for characterizing the composition of the outermost few nanometers of materials, and for imaging surface topography and chemistry. Presently the main techniques available are X-Ray Photoelectron Spectroscopy (XPS), Ultraviolet Photoelectron Spectroscopy (UPS), Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS), Matrix-Assisted Laser Desorption/Ionization mass spectrometry (MALDI) and Atomic Force Microscopy (AFM).

• A Scanning Near-Field Optical Microscope (Witec Alpha300 S) was installed in the Surface Analytical Facility in the spring of 2009. The SNOM instrument has Raman capability and features an integrated AFM to allow topographic and optical imaging of the same features without having to move the sample.

• ThermoScientific ESCALAB 250 X-ray Photoelectron Spectrometer (XPS)
• ION-TOF Model IV Time-of-Flight Secondary Ion Mass Spectrometer
  (Tof-SIMS)
• Waters Q-ToF Premier MALDI/ESI Tandem Mass Spectrometer
• Digital Instruments Multimode Atomic Force Microscope with IIIa controller (AFM)
• Woollam M44 spectroscopic ellipsometer (SE)
• WITEC alpha300 S Scanning Near-field Optical Microscope(SNOM)
• Phi Model 670 Scanning Auger Microscope (SAM)

• PDF of Surface Analytical Lab Brocure (PDF)
• CAMCOR Testing Services Agreement (PDF)

	Dr. Stephen Golledge Director, CAMCOR Surface Analytical Facility golledge@uoregon.edu 541.346.3617