A one day workshop emphasizing real world solutions to thin film and nano-particle characterization using the latest analytical methods, instrumental techniques, and software algorithms. Workshop will be held in the new Integrated Science Complex, Lorry I. Lokey Laboratory.

Focus on instrumental methods and applications for characterization of thin films and nano-particles using a wide variety of instrumental techniques including XRD, XPS, EPMA, TEM, FIB, SIMS and Auger. Application oriented presentations by analytical experts and applied materials scientists at University of Oregon, Oregon State University and Portland State University.

Dave Johnson, University of Oregon, Department of Chemistry
Doug Keszler, Oregon State University, Department of Chemistry
John Donovan, University of Oregon, CAMCOR
Steve Golledge, University of Oregon, CAMCOR
Kurt Langworthy, University of Oregon, CAMCOR
Mark Lonergan, University of Oregon, Department of Chemistry
Jim Hutchison, University of Oregon, Department of Chemistry
Janet Tate, Oregon State University, Department of Physics
Dave Schut, Voxtel, Inc
Peter Moeck, Portland State University, Department of Physics

Event flier (pdf)  |  Preliminary schedule (pdf)  |  Register Online! (pdf)