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| Transmission Electron Microscopy (TEM) |
| Titan 80-300 TEM with EDX and EELS |
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Instrument Calendar:
This facility offers the following TEM applications and techniques:
- 80-300 Kv field emission electron source
- 0.8 Angstrom resolution in TEM mode; 1.4 Angstrom STEM resolution
- Spherical aberration corrector (Cs Corrector)
- Bright field, dark field, and high angle annular dark field (HAADF) STEM imaging
- Gatan GIF for energy filtered imaging and electron energy loss spectroscopy
- Gatan 2K x 2K CCD for image capturing
- EDAX EDS detector for x-ray analysis and mapping
- High angle tomography stage and holders for TEM and STEM tomography
Typical Applications:
- HR-TEM bight field microscopy for biological and material samples
- STEM imaging
- Tomography (BF and STEM)
- Elemental analysis (EDS)
- EELS analysis and image filtering
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