The CAMCOR High Resolution and Analytical Facility provides the state-of-the-art equipments to perform the atomic-resolution imaging and the nanoscale composition analyses of hard and soft materials.
The facility is equipped to characterize sample types from multiple disciplines, such as semiconductor devices, solar cells, polymer, catalyst, multilayer thin films, geological and biological samples.
The main techniques available are:
- High-resolution transmission electron microscope (HRTEM)
- Atomic-resolution high-angle annular dark-field scanning transmission electron microscope (HAADF-STEM)
- Electron energy loss spectrometry (EELS) line scanning and 2D mapping
- Energy-dispersive X-ray spectrometry (EDS) line scanning and 2D mapping
- Energy-filtered TEM
- Bright-/dark-field TEM
- Cryo-TEM
- Selected area electron diffraction (SAED) and nanodiffraction
- STEM tomography and cryo-tomography
TEM related softwares available are:
- Gatan DigitalMicrograph which provides users to process and analyze images with TEM-oriented functions
- FEI TIA software enabling users to enhance image and data processing
- TrueImage software obtaining precise, directly interpretable results from high-resolution TEM beyond the point-resolution.
- Inspect3D software which dramatically speeds quality realignment and 3D reconstruction techniques
Announcements:
- FEI Tecnai G2 Spirit TEM has been installed in the high-resolution and analytical facility in April 2010. This microscope is operated at 20kV to 120kV, suitable for studies of biological, organic and other beam sensitive materials. For that purpose, this microscope is equipped with a FEI Eagle CCD camera (4k x 4k), 3D tomography and cryo-TEM capabilities.
Instrumentation includes:
Documentation:
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Kurt Langworthy
Director,
CAMCOR High Resolution and Analytical Facility
klangwor@uoregon.edu
541.346.3660 |
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| Instrument Calendars
Facility Calendar
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