Titan 80-300 TEM with EDX and EELS
This facility offers the following TEM applications and techniques:
- 80-300 Kv field emission electron source
- 0.8 Angstrom resolution in TEM mode; 1.4 Angstrom STEM resolution
-
Imaging Lens System Cs corrector
- Bright field, dark field, and high angle annular dark field (HAADF) STEM imaging
- Gatan GIF for energy filtered imaging and electron energy loss spectroscopy
- Gatan 2K x 2K CCD for image capturing
- EDAX EDS detector for x-ray analysis and mapping
- High angle tomography stage and holders for TEM and STEM tomography
Typical Applications:
- HR-TEM bight field microscopy for biological and material samples
- STEM imaging
- Tomography (BF and STEM)
- Elemental analysis (EDS)
- EELS analysis and image filtering
