Scintag XDS-2000 Pole Figure Diffractometer

3-axis Pole figure, Texture, and Stress (PTS) horizontal goniometer configured with an LN2 cooled germanium semiconductor detector
Up to twelve samples may be run, each with different scan ranges and rates
Extensive database of minerals and other inorganic compounds can be searched for potential matches
Samples can be analyzed in many forms, including powders, thin films, crystals, and solutions

In situ analysis of structural changes as a function of temperature
Phase identification possible using ICDD’s PDF-4 database
Used to analyze structural characteristics and to identify powders, thin films, and crystals.
Purity/quality control of materials and lattice parameter determination
Particle size determination and orientation of single crystals