Philips PANanalytical X’Pert XRD System
Philips PANanalytical features:
- Highspeed in situ X-Ray diffraction
- Inorganic phase analysis on powder and dyestuffs even on smallest sample quantities.
- Qualitative and quantitative phase analysis
- Measuring and illustration of kinetic reactions (crystalline phase transitions, kinetics of hydration, dehydration in mineral phases)
- Measuring of the thickness of poly-crystalline thin layers (3 nm to 300 nm) and interpretation of the roughness at the layer interface
- Characterisation of poly-crystalline layer systems
Typical Applications:
- Crystallographic measurements, thin-film thickness measurement
- Determination of crystal parameters by diffraction of high-energy X-rays
- Measurement of the distance between crystal planes
- Wafer characterization
