ION-TOF Model IV Time-of-Flight Secondary Ion Mass Spectrometer

ToF-SIMS provides:

• A mass spectrum of the outermost 12Å of a surface
• Identification of structural units present at the surface (e.g. monomeric components and repeat units)
• Fingerprint identification of polymers
• Information on surface degradation and contamination
• Spatial imaging of the surface chemistry
• A full mass spectrum from every pixel of an image
• High mass resolution
• Extremely high analytical sensitivity
• Destructive elemental depth profiles several thousand Å into the sample

Typical Applications:

• Identifying the elemental composition and the chemical status near the surface (around 5 angstrom) with high sensitivity (~1ppm) and high mass resolution (~9000).
• Distinguishing the different isotopes of the same element.
• Imaging the topography of surface using the secondary electrons.
• Mapping chemical species on the submicron scale.
• Ultra-thin depth profiling.