Digital Instruments Multimode Atomic Force Microscope with IIIa controller

AFM provides:

• Imaging of surface atoms with a lateral resolution of 1Å and a vertical resolution of 0.1Å
• Analysis under water and in controlled environments
• Atomic-scale surface manipulation and modification
• Quantitative measurement of surface roughness
• Biorecognition imaging (with functionalized tips)

Typical Applications:

• Imaging, measuring and manipulating matter at the nanoscale.
• Information is gathered by “feeling” the surface with a mechanical probe.
• Variable-deflection mode is useful for small, high-speed atomic resolution scans.
• Lateral Force mode measures frictional forces on a surface.
• Phase Imaging mode can be used to differentiate areas on a sample with such differing properties as friction, adhesion, and viscoelasticity.
• Force Modulation mode allows comparison of both height and material properties.